| Copyright: | AXTAL GmbH |
Standards for Quartz Crystal Units
Survey on Standards for Quartz Crystal Units, Ceramic Resonators, and Wafers
| International | German | Publication | Title |
| IEC | DIN IEC | 60122-1 | Quartz crystal units of assessed quality - Part 1: Generic specification |
| IEC | DIN IEC | 60122-2 | Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection |
| IEC | DIN IEC | 60122-2-1 | Quartz crystal units for frequency control and selection - Part 2 Section 1: Quartz crystals for microprocessor clock supply |
| IEC | DIN IEC | 60122-2-1-am1 | Amendment No.1 Annex A: Limiting the drive level of crystal units used with digital gates and on-chip oscillators to permissible values |
| IEC | DIN IEC | 60122-3 | Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections |
| IEC | DIN EN | 60444-1 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network |
| IEC | DIN IEC | 60444-1-am1 | Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network |
| IEC | DIN EN | 60444-2 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network Part 2: Phase offset method for the measurement of two-terminal parameters of quartz crystal units |
| IEC | DIN EN | 60444-4 | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network Part 4: Method for the measurement of load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units up to 30 MHz |
| IEC | DIN EN | 60444-5 | Measurement of quartz crystal unit parameters Part 5: Methods for measurement of quartz crystal devices for the determination of equivalent electrical parameters using automatic network analyser techniques and error correction |
| IEC | DIN EN | 60444-6 | Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD) |
| IEC | DIN EN | 60444-7 | Measurement of quartz crystal unit parameters Part 7: Measurement of activity and frequency dips of quartz crystal units |
| IEC | DIN EN | 60444-8 | Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units |
| IEC | DIN EN | 60444-9 | Measurement of quartz crystal unit parameters Part 9: Measurement of spurious resonances of piezoelectric crystal units |
| IEC | DIN EN | 60444-10 TS | Piezoelectric and dielectric devices for frequency control and selection - Measurement of quartz crystal unit parameters - Method for the determination of equivalent electrical parameters for GHz band |
| IEC | DIN EN | 60444-11 | Measurement of Quartz Crystal Unit Parameters - Part 11: Standard Method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction |
| IEC | DIN EN | 60483 | Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling |
| IEC | DIN EN | 60642 | Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions |
| IEC | DIN EN | 60642-am1 | Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions |
| IEC | DIN EN | 60642-2 | Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units |
| IEC | DIN EN | 60642-3 | Piezoelectric ceramic resonators - Part 3: Standard outlines |
| IEC | - | 60689 | Measurements and test methods for tuning-fork quartz crystal units in the range 10 to 200 KHz and standard values |
| IEC | DIN EN | 60758 | Synthetic quartz crystal - Specifications and guide to the use |
| IEC | DIN IEC | 61080 | Guide to the measurement of equivalent electrical parameters of quartz crystal units |
| IEC | DIN IEC | 61178-2 | Quartz crystal units – A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional specification – Capability approval |
| IEC | DIN IEC | 61178-2-1 | Quartz crystal units – A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional specification – Capability approval – Section 1: Blank detail specification |
| IEC | DIN IEC | 61178-3 | Quartz crystal units – A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 3: Sectional specification – Qualification approval |
| IEC | DIN IEC | 61178-3-1 | Quartz crystal units – A specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 3: Sectional specification – Qualification approval – Section 1: Blank detail specification |
| IEC | DIN EN | 61240 | Piezoelectric devices: Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection – General rules |
| IEC | DIN EN | 61253-1 | Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval |
| IEC | DIN EN | 61253-2 | Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval |
| IEC | DIN EN | 61253-2-1 | Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E |
| IEC | DIN EN | 61837-1 | Surface mounted piezoelectric devices for frequency control and selection – Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines |
| IEC | DIN EN | 61837-2 | Surface mounted piezoelectric devices for frequency control and selection – Standard outlines and terminal lead connections - Part 2: Ceramic enclosure outlines |
| IEC | DIN EN | 61837-3 | Surface mounted piezoelectric devices for frequency control and selection – Standard outlines and terminal lead connections - Part 3: Metal enclosures |
| IEC | DIN EN | 61837-4 | Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines |
| IEC | DIN IEC | 61994-1 TS | Piezoelectric and dielectric devices for frequency control and selection - Glossary Part 1: Piezoelectric and dielectric resonators |
| IEC | DIN IEC | 61994-4-1 TS | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal |
| IEC | DIN EN | 61994-4-2 TS | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics |
| IEC | DIN EN | 61994-4-4 TS | Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices |
| IEC | DIN EN | 62276 | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| EIA | -- | 512 | Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1kHz to 1 GHz |
| IEEE | -- | 176 | IEEE Standard on Piezoelectricity |
| IEEE | -- | 177 | IEEE Standard Definitions and Methods of Measurement for Piezoelectric Vibrators |
| IEEE | -- | 1139 | IEEE Standard Definitions of Physical Quantities for Fundamental Frequency an Time Metrology |
| MIL | -- | PRF-3098H | Performance Specification: General Specification for Quartz Crystal Units |
| MIL | -- | PRF-3098H | Supplement 1: Specification sheets |
Note:
This survey may deviate slightly from the actual situation. For the valid actual IEC standards please refer to the IEC website (Technical Committee TC-49).
IEC International Electrotechnical Commission